DesignCon 2011 On-Chip Characterization of Signal and Power Integrity in 3-D Packaged Systems

DesignCon 2010 Power Integrity and Noise Coupling Effects on Signal Integrity – Methodology for Identifying the Deterministic Jitter Components and their Generating Sources in Data Communication Systems

DesignCon 2006 Developing a “Physical” Model for Vias

Vias in printed circuit boards (PCBs) and packages are among the components of most concern with respect to signal and power integrity in high-speed communication systems. A good amount of research has been conducted to analyze their behavior. However, when it comes to " physical " or " physics-based " understanding and modeling, vias prove to be quite elusive due to their complex environment. ...

DESIGNCON 2009 SSO Noise, Eye Margin, and Jitter Characterization for I/O Power Integrity

In this paper, we describe the Power Integrity design and characterization for a single ended I/O interface through noise, EYE margin, and jitter measurements. The frequency domain techniques are used for designing the I/O PDN. For PDN characterization, onchip PDN elements are extracted through the VNA measurements. The peak to peak voltage noise is measured on-chip at the driver. The Eye margi...

Connectivity as a Measure of Power System Integrity

Measures of network structural integrity useful in the analysis and synthesis of power systems are discussed. Signal flow methodology is applied to derive an expression for the paths between sources and sinks in a power network. Connectivity and reach ability properties of the network are obtained using the minors of a modified connectivity matrix. Node-connectivity, branch connectivity and mix...

DesignCon 2011 Worst - Case Patterns for High - Speed Simulation and Measurement

Design and validation of high speed serial link at multi Gbps requires time-domain simulation and measurement. The pattern length for transistor level simulation is limited to a few hundred bits due to the practical simulation time while the pattern length for oscilloscope measurement is limited to a few hundred to a few thousand of bits due to the record length. This is where and why " killer ...